This Channel is dedicated to lectures/presentations on electronics and allied subjects. The main focus will be on following sub areas:

1. Semicondcutor Device Electronics
2. Analog Circuits & Systems
3. Integrated Circuits Fabrication
4. Thin Film Deposition & characterization
5. Semiconductor Characterization
6. Nanotechnology/Nanoelectronics
6. Sensors
7. MEMS

Photoluminiscence || PL
20:18
Photoluminiscence || PL
FTIR || Fourier Transform of Infrared Spectroscopy
23:04
FTIR || Fourier Transform of Infrared Spectroscopy
Metal Semicondcutor Contact || Ohmic Contact || Schottky Contact || Band Diagram
43:25
Metal Semicondcutor Contact || Ohmic Contact || Schottky Contact || Band Diagram
Scanning Electron Microscope || SEM || Part -1 || E-beam Techniques || Academic Talks
29:35
Scanning Electron Microscope || SEM || Part -1 || E-beam Techniques || Academic Talks
Four Probe Method
26:02
Four Probe Method
Two Stage CMOS Op-Amp || Multi Stage CMOS Amplifier || Frequency Response
42:27
Two Stage CMOS Op-Amp || Multi Stage CMOS Amplifier || Frequency Response
Coloumb Blockade & Single Electron Transistor
23:42
Coloumb Blockade & Single Electron Transistor
Low dimensional Systems || Nano Electronics || Semiconductors
25:49
Low dimensional Systems || Nano Electronics || Semiconductors
Active Resistors
52:28
Active Resistors
Current Mirror | Current Sources | MOSFET | Analog Electronics | Academic Talks
35:38
Current Mirror | Current Sources | MOSFET | Analog Electronics | Academic Talks
Current Sources | Integrated Circuits Design | Analog Electronics | Academic Talks
50:44
Current Sources | Integrated Circuits Design | Analog Electronics | Academic Talks
FinFET Structures
38:41
FinFET Structures
HF model
47:27
HF model
small signal model | MOSFET | Device Models | Semicondcutor Devices | Academic Talks
28:16
small signal model | MOSFET | Device Models | Semicondcutor Devices | Academic Talks
Short Channel Effects || MOSFETs || Nano Electronics || Academic Talks
49:47
Short Channel Effects || MOSFETs || Nano Electronics || Academic Talks
MOS DC Models II Equivalent Circuits II Semiconductor Devices II Academic Lectures
19:36
MOS DC Models II Equivalent Circuits II Semiconductor Devices II Academic Lectures
MOSFET DC model II DC Models II Device models II Acadmic Lectures
40:52
MOSFET DC model II DC Models II Device models II Acadmic Lectures
Device Models || Semiconductor Devices II Academic Talks
47:59
Device Models || Semiconductor Devices II Academic Talks
Wet Etching Process | SiO2 Etching | Si3N4 Etching | Aluminium Etching | Chemical Etching
44:29
Wet Etching Process | SiO2 Etching | Si3N4 Etching | Aluminium Etching | Chemical Etching
MOSFET Mobility || Effective Mobility || Semicondcutor Characterization || Academic Talks
39:14
MOSFET Mobility || Effective Mobility || Semicondcutor Characterization || Academic Talks
Transfer Length Method | TLM | Contact Resistance Measurment | Metal Semiconductor Contact
11:15
Transfer Length Method | TLM | Contact Resistance Measurment | Metal Semiconductor Contact
Contact Resistance Measurement | Metal Semicondcutor Contact | Semiconductor Characteization
55:26
Contact Resistance Measurement | Metal Semicondcutor Contact | Semiconductor Characteization
Contact Resistance | Metal Semiconductor Contact | Semiconductor characterization | Academic Talks
25:08
Contact Resistance | Metal Semiconductor Contact | Semiconductor characterization | Academic Talks
Secondary Ion Mass Spectroscopy | SIMS | Semicondcutor Characterization | Academic Talks
38:42
Secondary Ion Mass Spectroscopy | SIMS | Semicondcutor Characterization | Academic Talks
Atomic Force Microscope | Scanning Probe Microscope| Semiconductor Characterization | Academic Talks
38:33
Atomic Force Microscope | Scanning Probe Microscope| Semiconductor Characterization | Academic Talks
Scanning Tunneling Microscope | STM | SPM : Part-2 | Semicondcutor Characterization | Academic Talks
29:27
Scanning Tunneling Microscope | STM | SPM : Part-2 | Semicondcutor Characterization | Academic Talks
Scanning Probe Microscope | Part -1 | Semiconductor Characterization | Academic Talks
22:19
Scanning Probe Microscope | Part -1 | Semiconductor Characterization | Academic Talks
Electron Beam Induced Current (EBIC) | Semiconductor Characterization | Academic Talks
29:58
Electron Beam Induced Current (EBIC) | Semiconductor Characterization | Academic Talks
Copy of Electron Microprobe | Semicondcutor Characterization
49:24
Copy of Electron Microprobe | Semicondcutor Characterization
Auger Electron Spectroscopy | Semiconductor Characterization | Academic Talks
36:20
Auger Electron Spectroscopy | Semiconductor Characterization | Academic Talks